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SN54ABT8543 具有八路寄存總線收發(fā)器的掃描測試設備

數(shù)據(jù):

描述

The 'ABT8543 scan test devices with octal registered bus transceivers are members of the Texas Instruments SCOPETM testability integrated-circuit family. This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate testing of complex circuit-board assemblies. Scan access to the test circuitry is accomplished via the 4-wire test access port (TAP) interface.

In the normal mode, these devices are functionally equivalent to the 'F543 and 'ABT543 octal registered bus transceivers. The test circuitry can be activated by the TAP to take snapshot samples of the data appearing at the device pins or to perform a self-test on the boundary-test cells. Activating the TAP in normal mode does not affect the functional operation of the SCOPETM octal registered bus transceivers.

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Data flow in each direction is controlled by latch-enable ( and ), chip-enable ( and ), and output-enable ( and ) inputs. For A-to-B data flow, the device operates in the transparent mode when and are both low. When either or is high, the A data is latched. The B outputs are active when and are both low. When either or is high, the B outputs are in the high-impedance state. Control for B-to-A data flow is similar to that for A-to-B, but uses , , and .

In the test mode, the normal operation of the SCOPETM registered bus transceiver is inhibited and the test circuitry is enabled to observe and control the I/O boundary of the device. When enabled, the test circuitry performs boundary-scan test operations as described in IEEE Standard 1149.1-1990.

Four dedicated test pins control the operation of the test circuitry: test data input (TDI), test data output (TDO), test mode select (TMS), and test clock (TCK). Additionally, the test circuitry performs other testing functions such as parallel-signature analysis (PSA) on data inputs and pseudo-random pattern generation (PRPG) from data outputs. All testing and scan operations are synchronized to the TAP interface.

The SN54ABT8543 is characterized for operation over the full military temperature range of -55°C to 125°C. The SN74ABT8543 is characterized for operation from -40°C to 85°C.

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特性

  • 德州儀器SCOPE TM 可測性產品系列的成員
  • 與IEEE兼容標準1149.1-1990(JTAG)測試訪問端口和邊界掃描架構
  • 在功能上等效于正常功能模式下的'F543和'ABT543
  • SCOPE TM 指令集
    • IEEE標準1149.1-1990必需指令,可選INTEST,CLAMP和HIGHZ
    • 帶掩碼選項的輸入并行簽名分析
    • 偽 - 從輸出生成隨機模式
    • 樣本輸入/切換輸出
    • 輸出的二進制計數(shù)
    • 偶數(shù)奇偶校驗操作碼
  • 每I /O兩個邊界掃描單元以提高靈活性
  • 最先進的EPIC-IIB TM BiCMOS設計顯著降低功耗
  • 封裝選項包括塑料小外形(DW)和收縮小外形(DL)封裝,陶瓷芯片載體(FK)和標準陶瓷DIP s(JT)


SCOPE和EPIC-IIB是德州儀器公司的商標。

參數(shù) 與其它產品相比?邊界掃描 (JTAG)

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Technology Family
VCC (Min) (V)
VCC (Max) (V)
Bits (#)
ICC @ Nom Voltage (Max) (mA)
tpd @ Nom Voltage (Max) (ns)
IOL (Max) (mA)
Input Type
Output Type
Rating
Operating Temperature Range (C)
SN54ABT8543
ABT ? ?
4.5 ? ?
5.5 ? ?
8 ? ?
38 ? ?
5.8 ? ?
64 ? ?
TTL ? ?
TTL ? ?
Military ? ?
-55 to 125 ? ?